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Scanning probe microscope
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321	Noncontact atomic force microscopy II Mehmet Z. Baykara1 and Udo D. Schwarz2 Add to Reading List Source URL: www.ncbi.nlm.nih.gov Language: English Scientific method Atomic force microscopy Kelvin probe force microscope Scanning tunneling microscope Microscopy Microscope Characterization Optical microscope Nanotechnology Scanning probe microscopy Science Chemistry
322	Manipulation of nanoparticles of different shapes inside a scanning electron microscope Boris Polyakov1, Sergei Vlassov1,2,3, Leonid M. Dorogin2,3, Add to Reading List Source URL: www.ncbi.nlm.nih.gov Language: English* Nanoelectronics Atomic force microscopy Contact mechanics Nanowire Friction Wetting Electrostatics Physics Science Scanning probe microscopy
323	Influence of the adsorption geometry of PTCDA on Ag(111) on the tip–molecule forces in non-contact atomic force microscopy Add to Reading List Source URL: www.ncbi.nlm.nih.gov Language: English Scientific method Spectroscopy Intermolecular forces Atomic force microscopy Force spectroscopy Membrane biology Scanning tunneling microscope Microscopy Perylene Scanning probe microscopy Chemistry Science
324	Performance analysis of OFDM modulation on indoor broadband PLC channels Add to Reading List Source URL: www.ncbi.nlm.nih.gov Language: English Intermolecular forces Scanning probe microscopy Atomic force microscopy Scanning electron microscope Microscopy Electron microscope Microscope Characterization Environmental scanning electron microscope Scientific method Science Electron microscopy
325	VOLUME 83, NUMBER 23 PHYSICAL REVIEW LETTERS Add to Reading List Source URL: www.columbia.edu Language: English - Date: 2002-08-01 15:57:26 Scanning probe microscopy Materials science Electricity Physical quantities Quantum electronics Quantum dot Electrostatic force microscope Capacitor Atomic force microscopy Chemistry Physics Science
326	Simple Dark-Field Microscopy with Nanometer Spatial Precision and Microsecond Temporal Resolution Add to Reading List Source URL: www.nojilab.t.u-tokyo.ac.jp Language: English - Date: 2014-02-17 04:44:41 Optics Nanotechnology Nanomaterials Electromagnetism Scanning probe microscopy Optical microscope Nanoparticle Angular resolution Surface plasmon resonance Science Microscopy Laboratory techniques
327	Tutorial on Kelvin Probe Measurements By Dr. Rudy Schlaf Add to Reading List Source URL: rsl.eng.usf.edu Language: English - Date: 2006-09-27 17:36:18 Scanning probe microscopy Kelvin probe force microscope Surface chemistry Electricity Potential Work function Volta potential Vacuum Electron Physics Electromagnetism Condensed matter physics
328	Subatomic Features on the Silicon[removed]×7) Surface Observed by Atomic Force Microscopy Franz J. Giessibl, et al. Add to Reading List Source URL: www-inst.eecs.berkeley.edu Language: English - Date: 2008-05-05 18:07:04 Microscopes Intermolecular forces Scanning tunneling microscope Chemistry Atomic force microscopy Scanning tunneling spectroscopy Scanning probe microscopy Scientific method Science
329	PeakForce Tapping Mode AFM and Quantitative Nanomechanical Measurements Chunzeng Li on behalf of Veeco Team and Collaborators Add to Reading List Source URL: mse.ustb.edu.cn Language: English - Date: 2010-08-30 22:20:01 Intermolecular forces Atomic force microscopy Chemistry Microscope Veeco Scanning probe microscopy Scientific method Science
330	Microsoft Word - Reed publication list Add to Reading List Source URL: www.eng.yale.edu Language: English - Date: 2013-02-09 22:15:46 Microscopes Scanning probe microscopy Scanning tunneling microscope Superlattice Resonant-tunneling diode Nanowire Molecular scale electronics Anthony E. Siegman Electronics Nanotechnology Physics

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